Advantest BLB-019431 Fan Rotation Sensor PLB-219431AA1

Advantest BLB-019431 Fan Rotation Sensor PLB-219431AA1

Advantages and Benefits

Platform scalability enables outstanding device portfolio coverage and provides CoT advantages in one single scalable test platform

The widest range of compatible tester configurations, that scale from small footprint engineering systems to very high pin count wafer sort and final test systems for high volume manufacturing (HVM),

The broadest application coverage in the industry, from High Performance Compute (HPC) & AI, to mobile & RF, to automotive & industrial.

Compatibility across tester generations maximizes test capacity utilization and investment protection of test hardware

Probe card and device-under-test (DUT) boards, and test programs can be utilized across V93000 generations to provide:

Fast qualification and transition to new capabilities

Flexibility to efficiently utilize available test capacity

Investment protection for test hardware (systems, instruments, probe cards and final test interface hardware) and test engineering infrastructure, knowledge and training

n addition to amplifier analysis, a variety of display modes are available, such as

– Overlay display,

– Comparison with memory contents,

– Display of two independent graphs (split screen),

– Power meter function,

– Use of multiple markers,

– Normalized and direct readout of transmission loss and

– Automatic bandwidth analysis (e.g. measurement of half-value widths based on RMS and envelope methods),

– Curve fitting over the IEC/IEEE bus and many other features facilitate operation of the analyzer and simplify analysis.

Internal or external triggering is possible.

Measurement time is 0.8 seconds for a span of 200 nm and varies with the span.

Broadband light sources with a resolution of 5 nm have the highest sensitivity,

while narrowband light sources (lasers) can be reliably analyzed down to the noise level even with a narrow resolution bandwidth.

The normalization function combined with the white light source allows direct measurement of transmission and loss characteristics of filters and fibers.